M S E 552: Scanning and Auger Electron Microscopy
(Dual-listed with MAT E 452). (2-3) Cr. 3. F.
Prereq: PHYS 232
Characterization of materials using scanning electron microscope (SEM), electron microprobe, and auger spectrometer. Compositional determination using energy and wavelength dispersive x-ray and Auger spectroscopies. Specimen preparation. Laboratory covers SEM operation.
...E 311 Thermodynamics in Materials Engineering M S...E E 552 Energy System Planning E E...