MATE 4520: Scanning and Auger Electron Microscopy
Credits: 3. Contact Hours: Lecture 2, Laboratory 3.
Prereq: PHYS 2320
Characterization of materials using scanning electron microscopes (SEM) and variants thereof, including electron microprobe, Auger spectrometer, and DualBeam focused ion beams (FIB)/SEMs). Compositional determination using energy and wavelength dispersive x-ray and Auger spectroscopies. Orientation determination using electron backscattered diffraction. Specimen preparation. Laboratory covers SEM operation.
(Typically Offered: Fall)